O Prof. Wuqiang Yang está nos visitando durante esta semana. Estamos discutindo a colaboração em pesquisas no campo da instrumentação e medição de RF/microondas.
Prof. Wuqiang Yang é Fellow do IEEE e atua na Escola de Engenharias eletétrica e eletrônica da Universidade de Manchester, UK.
Durante sua visita, ele ministrará a palestra:“Current status of industrial tomography and applications of ECT “
Data: 19/09/2016 at 15h30
Local: PGEEL02 – EEL/CTC/UFSC
Summary of the lecture
Although multiphase flow measurement has been a research topic for many years, it still presents great challenges in industry, such as in the oil, pharmaceutical, petrochemical and power industries. As a non-intrusive imaging and measurement technique, industrial tomography has been developed since 1980s. One of the most important targets of industrial tomography is multiphase flow measurement. In the past 30 years, various industrial tomography modalities have been developed, including (from high frequency to low frequency) gamma-ray, x-ray, optical, near infrared, THz, microwave, capacitance, resistance, magnetic and ultrasonic. This talk intends to review the current status of industrial tomography. Among various industrial tomography techniques, electrical capacitance tomography (ECT) is most mature and has biggest potential for industrial applications. ECT has been used to investigate gas/oil/water flow measurement, pharmaceutical fluidised beds, circulating fluidised beds and in other applications. It is foreseen that ECT will make more social and economic impact than any other industrial tomography modalities, in particular in clean use of coal, which is very important for protection of the environment by reducing PM2.5.
Professor Wuqiang Yang (FIET, FInstMC, FIEEE, CEng) received his BEng (Distinction) 1982, MSc 1985 and PhD (Distinction) 1988, from Tsinghua University. After 3 years as a Lecturer at Tsinghua University, he joined UMIST in 1991. His research is focused on electrical capacitance tomography (ECT), has published 300 papers and a book “Sensor Array“, and holds 10 patents, including 2 WO patents, which have been licensed to industry. He is an Associate Editor ofIEEE Trans. IM and an editorial board member of 7 other journals, including Meas. Sci. Technol. and Sensor Review, and reviews papers for 40 journals, including 6 IEEE journals. He has been invited by many universities and research institutions worldwide and international conferences to give lectures/seminars/keynotes. He is a visiting professor at 8 universities, including Tsinghua University. He is recognised by International Center for Scientific Research (France), as one of top 30 technology researchers in the world, and Intota as an expert. Since 2010, he is an IEEE IMS Distinguished Lecturer. His biography has been included in Who’s Who in the World, Who’s Who in Science and Eng. and Who’s Who in America since 2002. In 2006 he received Global Research Award from the Royal Academy of Eng. and took sabbatical leave atMassachusetts Institute of Technology (MIT) in USA as a visiting professor. He has received many awards, including 1997 IEE/NPL Wheatstone Measurement Prize, 1997 Honeywell Prize from InstMC, 2000 IEE Ayrton Premium, 2008 Outstanding Organization award from IEEE IM Society, 2009 Valued Reviewer from Sensors and Actuators journal, 2009 IET Innovation Award Finalist, and 2010 Outstanding Reviewer from Sensor Review journal. He was an honorary chairman of IEEE Int. Conference on Imaging Systems and Techniques and will be the General Chair of 2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC’2018), which will be held in Manchester. He organised 2 special issues in 2013 for IEEE Trans. IM and Meas. Sci. Technol. as a Guest Editor. He is a panel member of NSFC and a reviewer for 973. He has just been awarded Invitation Fellowship by Japanese Society for the Promotion of Science.